GRUPO DE INVESTIGACION EN DISPOSITIVOS ELECTRONICOS
GRIDE
Université de Caen Basse-Normandie
Caen, FranciaPublicaciones en colaboración con investigadores/as de Université de Caen Basse-Normandie (2)
2013
-
Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs
ECS Transactions
-
Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: Challenges and opportunities
ECS Journal of Solid State Science and Technology, Vol. 2, Núm. 11