Soochow University-ko ikertzaileekin lankidetzan egindako argitalpenak (2)

2020

  1. Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

    IEEE International Reliability Physics Symposium Proceedings

2019

  1. Time series statistical analysis: A powerful tool to evaluate the variability of resistive switching memories

    Journal of Applied Physics, Vol. 125, Núm. 17