Publicacions en col·laboració amb investigadors/es de University of Montpellier (4)

2015

  1. Thickness Characterization by Capacitance Derivative in FDSOI p-i-n Gated Diodes

    2015 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS)

2014

  1. CMOS V<sub>T</sub> Characterization by Capacitance Measurements in FDSOI PIN Gated Diodes

    PROCEEDINGS OF THE 2014 44TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2014)

2013

  1. Unusual Short-Channel Effects in SOI MOSFETs

    2013 INTERNATIONAL CONFERENCE ON SEMICONDUCTOR TECHNOLOGY FOR ULTRA LARGE SCALE INTEGRATED CIRCUITS AND THIN FILM TRANSISTORS (ULSIC VS. TFT 4)

  2. Why are SCE overestimated in FD-SOI MOSFETs?

    2013 PROCEEDINGS OF THE EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC)