Instituto de Microelectrónica de Barcelona -ko ikertzaileekin lankidetzan egindako argitalpenak (2)

2016

  1. New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM

    Solid-State Electronics, Vol. 115, pp. 140-145

2015

  1. A new high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM

    EUROSOI-ULIS 2015 - 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon