Publicaciones en las que colabora con Lindsay M. Jurczak (3)

2013

  1. Reliability insights into low frequency noise in high-mobility transistors

    Solid State Technology, Vol. 56, Núm. 2, pp. 25-28

2012

  1. Insights in low frequency noise of advanced and high-mobility channel transistors

    Technical Digest - International Electron Devices Meeting, IEDM

  2. On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs

    European Solid-State Device Research Conference