Instituto Nacional de Astrofísica, Óptica y Electrónica-ko ikertzaileekin lankidetzan egindako argitalpenak (2)

2020

  1. Systematic characterization of random telegraph noise and its dependence with magnetic fields in MOSFET devices

    Noise in Nanoscale Semiconductor Devices (Springer International Publishing), pp. 135-174

2018

  1. Experimental characterization of the random telegraph noise signature in MOSFETs under the Influence of Magnetic Fields

    IEEE Electron Device Letters, Vol. 39, Núm. 7, pp. 1054-1057