Instituto de Microelectrónica de Barcelona -ko ikertzaileekin lankidetzan egindako argitalpenak (3)

2024

  1. Neuromorphic Technology Insights in Spain

    Proceedings of the IEEE Conference on Nanotechnology

2016

  1. New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM

    Solid-State Electronics, Vol. 115, pp. 140-145

2015

  1. A new high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM

    EUROSOI-ULIS 2015 - 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon