Publicaciones en colaboración con investigadores/as de Soochow University (3)

2023

  1. Modeling the Variability of Au/Ti/h-BN/Au Memristive Devices

    IEEE Transactions on Electron Devices, Vol. 70, Núm. 4, pp. 1533-1539

2020

  1. Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

    IEEE International Reliability Physics Symposium Proceedings

2019

  1. Time series statistical analysis: A powerful tool to evaluate the variability of resistive switching memories

    Journal of Applied Physics, Vol. 125, Núm. 17