ELECTRÓNICA Y TECNOLOGÍA DE COMPUTADORES
Fachbereich
Philips Research Eindhoven
Amsterda, HolandaPublikationen in Zusammenarbeit mit Forschern von Philips Research Eindhoven (2)
2005
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A new algorithm for dynamic faults detection in RAMs
Proceedings of the IEEE VLSI Test Symposium
2001
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A special march test to detect delay coupling faults for RAMS
Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems