Publicaciones en colaboración con investigadores/as de Instituto de Microelectrónica de Barcelona (12)

2018

  1. A Kinetic Monte Carlo Simulator to Characterize Resistive Switching and Charge Conduction in Ni/HfO 2 /Si RRAMs

    Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

2015

  1. A new high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM

    EUROSOI-ULIS 2015 - 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon

2014

  1. Measurement of χc1and χc2production with √s = 7 TeV pp collisions at ATLAS

    Journal of High Energy Physics, Vol. 2014, Núm. 7