Characterization of oxygen related defects in silicon p-n junctions
- Jiménez Tejada, J.A.
- López Villanueva, J.A.
- Godoy, A.
- Gómez-Campos, F.M.
- Rodríguez-Bolívar, S.
- Carceller, J.E.
Proceedings:
2005 Spanish Conference on Electron Devices, Proceedings
ISBN: 9780780388109
Year of publication: 2005
Volume: 2005
Pages: 37-40
Type: Conference paper