Characterization of oxygen related defects in silicon p-n junctions

  1. Jiménez Tejada, J.A.
  2. López Villanueva, J.A.
  3. Godoy, A.
  4. Gómez-Campos, F.M.
  5. Rodríguez-Bolívar, S.
  6. Carceller, J.E.
Aktak:
2005 Spanish Conference on Electron Devices, Proceedings

ISBN: 9780780388109

Argitalpen urtea: 2005

Alea: 2005

Orrialdeak: 37-40

Mota: Biltzar ekarpena

DOI: 10.1109/SCED.2005.1504300 GOOGLE SCHOLAR
Datuen iturria: Scopus