Optimum design in a JFET for minimum generation-recombination noise

  1. Godoy, A.
  2. Jiménez-Tejada, J.A.
  3. Palma, A.
  4. Carceller, J.E.
Revue:
Microelectronics Reliability

ISSN: 0026-2714

Année de publication: 2000

Volumen: 40

Número: 11

Pages: 1965-1968

Type: Article

DOI: 10.1016/S0026-2714(00)00084-6 GOOGLE SCHOLAR
La source de données: Scopus