Modeling effects of electron-velocity overshoot in a MOSFET

  1. Roldán, J.B.
  2. Gámiz, F.
  3. López-Villanueva, J.A.
  4. Carceller, J.E.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 1997

Volume: 44

Issue: 5

Pages: 841-846

Type: Article

DOI: 10.1109/16.568047 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus