A high-frequency bidirectional capacitance method to study the evolution of the interface state density generated at low temperatures

  1. Lopez-Villanueva, J.A.
  2. Jimenez-Tejada, J.A.
  3. Cartujo, P.
  4. Bausells, J.
  5. Carceller, J.E.
Journal:
Solid State Electronics

ISSN: 0038-1101

Year of publication: 1992

Volume: 35

Issue: 1

Pages: 73-81

Type: Article

DOI: 10.1016/0038-1101(92)90307-X GOOGLE SCHOLAR
Data source: Scopus