A high-frequency bidirectional capacitance method to study the evolution of the interface state density generated at low temperatures

  1. Lopez-Villanueva, J.A.
  2. Jimenez-Tejada, J.A.
  3. Cartujo, P.
  4. Bausells, J.
  5. Carceller, J.E.
Revue:
Solid State Electronics

ISSN: 0038-1101

Année de publication: 1992

Volumen: 35

Número: 1

Pages: 73-81

Type: Article

DOI: 10.1016/0038-1101(92)90307-X GOOGLE SCHOLAR
La source de données: Scopus