Systematic method for electrical characterization of random telegraph noise in MOSFETs

  1. Marquez, C.
  2. Rodriguez, N.
  3. Gamiz, F.
  4. Ohata, A.
Revue:
Solid-State Electronics

ISSN: 0038-1101

Année de publication: 2017

Volumen: 128

Pages: 115-120

Type: Article

DOI: 10.1016/J.SSE.2016.10.031 GOOGLE SCHOLAR
La source de données: Scopus