Direct point-contact characterization of Bias instability on bare SOI wafers

  1. Marquez, C.
  2. Rodriguez, N.
  3. Fernandez, C.
  4. Ohata, A.
  5. Gamiz, F.
  6. Allibert, F.
  7. Cristoloveanu, S.
Konferenzberichte:
2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2013

ISBN: 9781479913602

Datum der Publikation: 2013

Art: Konferenz-Beitrag

DOI: 10.1109/S3S.2013.6716529 GOOGLE SCHOLAR
Datenquelle: Scopus