Direct point-contact characterization of Bias instability on bare SOI wafers

  1. Marquez, C.
  2. Rodriguez, N.
  3. Fernandez, C.
  4. Ohata, A.
  5. Gamiz, F.
  6. Allibert, F.
  7. Cristoloveanu, S.
Aktak:
2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2013

ISBN: 9781479913602

Argitalpen urtea: 2013

Mota: Biltzar ekarpena

DOI: 10.1109/S3S.2013.6716529 GOOGLE SCHOLAR
Datuen iturria: Scopus