Direct point-contact characterization of Bias instability on bare SOI wafers

  1. Marquez, C.
  2. Rodriguez, N.
  3. Fernandez, C.
  4. Ohata, A.
  5. Gamiz, F.
  6. Allibert, F.
  7. Cristoloveanu, S.
Proceedings:
2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2013

ISBN: 9781479913602

Year of publication: 2013

Type: Conference paper

DOI: 10.1109/S3S.2013.6716529 GOOGLE SCHOLAR
Data source: Scopus