A comparison of models for phonon scattering in silicon inversion layers
ISSN: 0021-8979
Année de publication: 1995
Volumen: 77
Número: 8
Pages: 4128-4129
Type: Révision
ISSN: 0021-8979
Année de publication: 1995
Volumen: 77
Número: 8
Pages: 4128-4129
Type: Révision