Accurate calculation of gate tunneling current in double-gate and single-gate SOI MOSFETs through gate dielectric stacks
- Chaves, F.A.
- Jiménez, D.
- García Ruiz, F.J.
- Godoy, A.
- Suñé, J.
ISSN: 0018-9383
Year of publication: 2012
Volume: 59
Issue: 10
Pages: 2589-2596
Type: Article