Universal Built-In Self-Test Procedure for CMOS PLA’s

  1. Ortega, J.
  2. Prieto, A.
  3. Lloris, A.
  4. Pelayo, F.
Revue:
IEEE Transactions on Circuits and Systems

ISSN: 0098-4094

Année de publication: 1991

Volumen: 38

Número: 8

Pages: 941-945

Type: Article

DOI: 10.1109/31.85635 GOOGLE SCHOLAR
La source de données: Scopus