CARLOS
NAVARRO MORAL
PROFESOR TITULAR DE UNIVERSIDAD
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Grenoble Institute of Technology
Grenoble, FranciaPublicacións en colaboración con investigadores/as de Grenoble Institute of Technology (13)
2018
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MSDRAM, A2RAM and Z<SUP>2</SUP>-FET performance benchmark for 1T-DRAM applications
2018 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD 2018)
2017
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Low-Power Z<SUP>2</SUP>-FET Capacitorless 1T-DRAM
2017 IEEE 9TH INTERNATIONAL MEMORY WORKSHOP (IMW)
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The mystery ofthe Z<SUP>2</SUP>-FET 1 T-DRAM memory
2017 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2017)
2016
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Body factor scaling in UTBB SOI with supercoupling effect
2016 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2016)
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Influence of source-drain engineering and temperature on split-capacitance characteristics of FDSOI p-i-n gated diodes
2016 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S)
2015
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Back-gate effects and detailed characterization of junctionless transistor
ESSDERC 2015 PROCEEDINGS OF THE 45TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE
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Impact of Supercoupling Effect on Mobility Enhancement in UTBB SOI in Dynamic Threshold Mode
2015 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S)
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Reliability of film thickness extraction through CV curves of SOI p-i-n gated diodes
2015 30TH SYMPOSIUM ON MICROELECTRONICS TECHNOLOGY AND DEVICES (SBMICRO)
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Thickness Characterization by Capacitance Derivative in FDSOI p-i-n Gated Diodes
2015 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS)
2014
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Beyond TFET: Alternative Mechanisms for CMOS-Compatible Sharp-Switching Devices
2014 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S)
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CMOS V<sub>T</sub> Characterization by Capacitance Measurements in FDSOI PIN Gated Diodes
PROCEEDINGS OF THE 2014 44TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2014)
2013
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Unusual Short-Channel Effects in SOI MOSFETs
2013 INTERNATIONAL CONFERENCE ON SEMICONDUCTOR TECHNOLOGY FOR ULTRA LARGE SCALE INTEGRATED CIRCUITS AND THIN FILM TRANSISTORS (ULSIC VS. TFT 4)
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Why are SCE overestimated in FD-SOI MOSFETs?
2013 PROCEEDINGS OF THE EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC)