Publicacións en colaboración con investigadores/as de Grenoble Institute of Technology (13)

2018

  1. MSDRAM, A2RAM and Z<SUP>2</SUP>-FET performance benchmark for 1T-DRAM applications

    2018 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD 2018)

2017

  1. Low-Power Z<SUP>2</SUP>-FET Capacitorless 1T-DRAM

    2017 IEEE 9TH INTERNATIONAL MEMORY WORKSHOP (IMW)

  2. The mystery ofthe Z<SUP>2</SUP>-FET 1 T-DRAM memory

    2017 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2017)

2016

  1. Body factor scaling in UTBB SOI with supercoupling effect

    2016 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2016)

  2. Influence of source-drain engineering and temperature on split-capacitance characteristics of FDSOI p-i-n gated diodes

    2016 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S)

2015

  1. Back-gate effects and detailed characterization of junctionless transistor

    ESSDERC 2015 PROCEEDINGS OF THE 45TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE

  2. Impact of Supercoupling Effect on Mobility Enhancement in UTBB SOI in Dynamic Threshold Mode

    2015 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S)

  3. Reliability of film thickness extraction through CV curves of SOI p-i-n gated diodes

    2015 30TH SYMPOSIUM ON MICROELECTRONICS TECHNOLOGY AND DEVICES (SBMICRO)

  4. Thickness Characterization by Capacitance Derivative in FDSOI p-i-n Gated Diodes

    2015 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS)

2014

  1. Beyond TFET: Alternative Mechanisms for CMOS-Compatible Sharp-Switching Devices

    2014 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S)

  2. CMOS V<sub>T</sub> Characterization by Capacitance Measurements in FDSOI PIN Gated Diodes

    PROCEEDINGS OF THE 2014 44TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2014)

2013

  1. Unusual Short-Channel Effects in SOI MOSFETs

    2013 INTERNATIONAL CONFERENCE ON SEMICONDUCTOR TECHNOLOGY FOR ULTRA LARGE SCALE INTEGRATED CIRCUITS AND THIN FILM TRANSISTORS (ULSIC VS. TFT 4)

  2. Why are SCE overestimated in FD-SOI MOSFETs?

    2013 PROCEEDINGS OF THE EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC)