Publicaciones en las que colabora con Mireia Bargalló González (3)

2015

  1. A new high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM

    EUROSOI-ULIS 2015 - 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon

  2. Analysis of set and reset mechanisms in Ni/HfO2-based RRAM with fast ramped voltages

    Microelectronic Engineering, Vol. 147, pp. 176-179