JUAN ELOY RUIZ CASTRO-rekin lankidetzan egindako argitalpenak (4)

2021

  1. Advanced temperature dependent statistical analysis of forming voltage distributions for three different HfO2-based RRAM technologies

    Solid-State Electronics, Vol. 176

2020

  1. Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

    IEEE International Reliability Physics Symposium Proceedings

2019

  1. Analysis of the statistics of device-to-device and cycle-to-cycle variability in TiN/Ti/Al:HfO2/TiN RRAMs

    Microelectronic Engineering, Vol. 214, pp. 104-109

  2. Phase-type distributions for studying variability in resistive memories

    Journal of Computational and Applied Mathematics, Vol. 345, pp. 23-32