Publicaciones en las que colabora con ANTONIO LLORÍS RUIZ (18)

1999

  1. Nondeterministic AND-EXOR minimisation by using rewrite rules and simulated annealing

    IEE Proceedings: Computers and Digital Techniques, Vol. 146, Núm. 1, pp. 1-7

  2. Using PVM for distributed logic minimization in a network of computers

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

1998

  1. Testability of AND-EXOR logic vs. AND-OR logic

    Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

1997

  1. Minimización and-exor de funciones lógicas

    Universidad de Granada

  2. Modified boltzmann machine for an efficient distributed implementation

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

1993

  1. Diagnosis de circuitos analógicos mediante signaturas basadas en variaciones de parámetros de alto nivel

    VIII Congreso Diseño de Circuitos Integrados: Málaga, 9 al 11 de noviembre de 1993

  2. Generalized Hopfield Neural Network for Concurrent Testing

    IEEE Transactions on Computers, Vol. 42, Núm. 8, pp. 898-912

  3. Test-Pattern Generation Based on Reed-Muller Coefficients

    IEEE Transactions on Computers, Vol. 42, Núm. 8, pp. 968-980

1991

  1. Aplicación del espectro de Reed-Muller a la generación de patrones de test

    Diseño de circuitos integrados: actas del VI Congreso. Santander, 11/15 de noviembre de 1991

  2. CMOS current-mode multivalued PLA's

    IEEE transactions on circuits and systems, Vol. 38, Núm. 4, pp. 434-441

  3. Fast Tamari transform

    IEE Proceedings E: Computers and Digital Techniques, Vol. 138, Núm. 3, pp. 147-153

  4. Optimization problems on concurrent testing solved by neural networks

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

  5. TESEO: algoritmo eficiente para la generación algebraica de patrones de test

    Diseño de circuitos integrados: actas del VI Congreso. Santander, 11/15 de noviembre de 1991

  6. Universal Built-In Self-Test Procedure for CMOS PLA’s

    IEEE Transactions on Circuits and Systems, Vol. 38, Núm. 8, pp. 941-945

  7. Using reed-muller coefficients to synthesise optimal prediction modules for concurrent testing

    Electronics Letters, Vol. 27, Núm. 14, pp. 1243-1245