Publications in collaboration with researchers from Universidade de São Paulo (4)

2013

  1. Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs

    ECS Transactions

  2. Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: Challenges and opportunities

    ECS Journal of Solid State Science and Technology, Vol. 2, Núm. 11

2012

  1. Dependence of generation-recombination noise with gate voltage in FD SOI MOSFETs

    IEEE Transactions on Electron Devices, Vol. 59, Núm. 10, pp. 2780-2786

  2. On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs

    European Solid-State Device Research Conference