Effects of oxygen related defects on the electrical and thermal behavior of a n+ - p junction

  1. Jiménez Tejada, J.A.
  2. Godoy, A.
  3. Carceller, J.E.
  4. López Villanueva, J.A.
Aldizkaria:
Journal of Applied Physics

ISSN: 0021-8979

Argitalpen urtea: 2004

Alea: 95

Zenbakia: 2

Orrialdeak: 561-570

Mota: Artikulua

DOI: 10.1063/1.1633344 GOOGLE SCHOLAR
Datuen iturria: Scopus