Effects of oxygen related defects on the electrical and thermal behavior of a n+ - p junction

  1. Jiménez Tejada, J.A.
  2. Godoy, A.
  3. Carceller, J.E.
  4. López Villanueva, J.A.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 2004

Volumen: 95

Número: 2

Pages: 561-570

Type: Article

DOI: 10.1063/1.1633344 GOOGLE SCHOLAR