Effect of polysilicon depletion charge on electron mobility in ultrathin oxide MOSFETs

  1. Gámiz, F.
  2. Godoy, A.
  3. Roldán, J.B.
  4. Carceller, J.E.
  5. Cartujo, P.
Aldizkaria:
Semiconductor Science and Technology

ISSN: 0268-1242

Argitalpen urtea: 2003

Alea: 18

Zenbakia: 11

Orrialdeak: 927-937

Mota: Artikulua

DOI: 10.1088/0268-1242/18/11/304 GOOGLE SCHOLAR