Electron velocity overshoot in strained Si/Si1-xGexMOSFETs

  1. Gamiz, F.
  2. Lopez-Villanueva, J.A.
  3. Roldan, J.B.
  4. Carceller, J.E.
  5. Cartujo, P.
Proceedings:
European Solid-State Device Research Conference

ISSN: 1930-8876

ISBN: 9782863321966

Year of publication: 1996

Pages: 413-414

Type: Conference paper

GOOGLE SCHOLAR
Data source: Scopus