In-depth study of quantum effects in SOI DGMOSFETs for different crystallographic orientations
- Balaguer, M.
- Roldán, J.B.
- Gamiz, F.
ISSN: 0018-9383
Year of publication: 2011
Volume: 58
Issue: 12
Pages: 4438-4441
Type: Article
ISSN: 0018-9383
Year of publication: 2011
Volume: 58
Issue: 12
Pages: 4438-4441
Type: Article