Modeling the equivalent oxide thickness of Surrounding Gate SOI devices with high-κ insulators
ISSN: 0038-1101
Année de publication: 2008
Volumen: 52
Número: 12
Pages: 1854-1860
Type: Article
ISSN: 0038-1101
Année de publication: 2008
Volumen: 52
Número: 12
Pages: 1854-1860
Type: Article