Coulomb scattering model for ultrathin silicon-on-insulator inversion layers

  1. Gamiz, F.
  2. Jiménez-Molinos, F.
  3. Roldán, J.B.
  4. Cartujo-Cassinello, P.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 2002

Volumen: 80

Número: 20

Pages: 3835-3837

Type: Article

DOI: 10.1063/1.1477623 GOOGLE SCHOLAR
La source de données: Scopus