Role of surface-roughness scattering in double gate silicon-on-insulator inversion layers

  1. Gámiz, F.
  2. Roldán, J.B.
  3. Cartujo-Cassinello, P.
  4. López-Villanueva, J.A.
  5. Cartujo, P.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 2001

Volume: 89

Issue: 3

Pages: 1764-1770

Type: Article

DOI: 10.1063/1.1331076 GOOGLE SCHOLAR
Data source: Scopus