Role of surface-roughness scattering in double gate silicon-on-insulator inversion layers

  1. Gámiz, F.
  2. Roldán, J.B.
  3. Cartujo-Cassinello, P.
  4. López-Villanueva, J.A.
  5. Cartujo, P.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 2001

Volumen: 89

Número: 3

Pages: 1764-1770

Type: Article

DOI: 10.1063/1.1331076 GOOGLE SCHOLAR
La source de données: Scopus