Merit function segmentation dependence on the isoplanatic patch criterion

  1. Pizarro, C.
  2. Diaz, J.A.
Actas:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819464279

Ano de publicación: 2006

Volume: 6342 II

Tipo: Achega congreso

DOI: 10.1117/12.692227 GOOGLE SCHOLAR