Artículos (12) Publicaciones en las que ha participado algún/a investigador/a

1999

  1. A look-up scheme for scaling in the RNS

    IEEE Transactions on Computers, Vol. 48, Núm. 7, pp. 748-751

  2. A study of struvite precipitation and urease activity in bacteria isolated from patients with urinary infections and their possible involvement in the formation of renal calculi

    Urologia Internationalis, Vol. 63, Núm. 3, pp. 188-192

  3. Comments on an arithmetic free parallel mixed-radix conversion algorithm

    IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, Vol. 46, Núm. 9, pp. 1259-1260

  4. Computational study of the strained-Si MOSFET: A possible alternative for the next century electronics industry

    Computer Physics Communications, Vol. 121, pp. 547-549

  5. Electron mobility in extremely thin single-gate silicon-on-insulator inversion layers

    Journal of Applied Physics, Vol. 86, Núm. 11, pp. 6269-6275

  6. Experimental determination of the effective mobility in NMOSFETs: a comparative study

    Solid-State Electronics, Vol. 43, Núm. 4, pp. 701-707

  7. Hole confinement and energy subbands in a silicon inversion layer using the effective mass theory

    Journal of Applied Physics, Vol. 86, Núm. 1, pp. 438-444

  8. Lee-Yang zeros and the Ising model on the Sierpinski gasket

    Journal of Physics A: Mathematical and General, Vol. 32, Núm. 27, pp. 5017-5027

  9. Local Larmor clock approach to the escape time

    Physics Letters, Section A: General, Atomic and Solid State Physics, Vol. 260, Núm. 3-4, pp. 286-293

  10. Nondeterministic AND-EXOR minimisation by using rewrite rules and simulated annealing

    IEE Proceedings: Computers and Digital Techniques, Vol. 146, Núm. 1, pp. 1-7

  11. RNS implementation of FIR filters based on distributed arithmetic using field-programmable logic

    Proceedings - IEEE International Symposium on Circuits and Systems, Vol. 1

  12. Surface roughness at the Si-SiO2 interfaces in fully depleted silicon-on-insulator inversion layers

    Journal of Applied Physics, Vol. 86, Núm. 12, pp. 6854-6863