A model for the drain current of deep submicrometer MOSFET's including electron-velocity overshoot
ISSN: 0018-9383
Année de publication: 1998
Volumen: 45
Número: 10
Pages: 2249-2251
Type: Article
ISSN: 0018-9383
Année de publication: 1998
Volumen: 45
Número: 10
Pages: 2249-2251
Type: Article