A non-destructive method to determine impurity-profiles in non-abrupt p-n junctions with deep levels
ISSN: 0038-1101
Year of publication: 1992
Volume: 35
Issue: 12
Pages: 1729-1736
Type: Article
ISSN: 0038-1101
Year of publication: 1992
Volume: 35
Issue: 12
Pages: 1729-1736
Type: Article