A non-destructive method to determine impurity-profiles in non-abrupt p-n junctions with deep levels

  1. Jimenez-Tejada, J.A.
  2. Lopez-Villanueva, J.A.
  3. Cartujo, P.
  4. Carceller, J.E.
Revue:
Solid State Electronics

ISSN: 0038-1101

Année de publication: 1992

Volumen: 35

Número: 12

Pages: 1729-1736

Type: Article

DOI: 10.1016/0038-1101(92)90253-9 GOOGLE SCHOLAR
La source de données: Scopus