A non-destructive method to determine impurity-profiles in non-abrupt p-n junctions with deep levels

  1. Jimenez-Tejada, J.A.
  2. Lopez-Villanueva, J.A.
  3. Cartujo, P.
  4. Carceller, J.E.
Aldizkaria:
Solid State Electronics

ISSN: 0038-1101

Argitalpen urtea: 1992

Alea: 35

Zenbakia: 12

Orrialdeak: 1729-1736

Mota: Artikulua

DOI: 10.1016/0038-1101(92)90253-9 GOOGLE SCHOLAR