Deep submicrometer SOI MOSFET drain current model including series resistance, self-heating and velocity overshoot effects
ISSN: 0741-3106
Année de publication: 2000
Volumen: 21
Número: 5
Pages: 239-241
Type: Article
ISSN: 0741-3106
Année de publication: 2000
Volumen: 21
Número: 5
Pages: 239-241
Type: Article