Two-dimensional drift-diffusion simulation of superficial strained-Si/Si1-xGex channel metal-oxide-semiconductor field-effect transistors
ISSN: 1071-1023
Année de publication: 1998
Volumen: 16
Número: 3
Pages: 1538-1540
Type: Article
ISSN: 1071-1023
Année de publication: 1998
Volumen: 16
Número: 3
Pages: 1538-1540
Type: Article