Coulomb scattering in strained-silicon inversion layers on Si1-xGex substrates

  1. Gámiz, F.
  2. Roldán, J.B.
  3. López-Villanueva, J.A.
  4. Cartujo, P.
Journal:
Applied Physics Letters

ISSN: 0003-6951

Year of publication: 1996

Volume: 69

Issue: 6

Pages: 797-799

Type: Article

DOI: 10.1063/1.117895 GOOGLE SCHOLAR
Data source: Scopus