Influence of Punch Trough Stop Layer and Well Depths on the Robustness of Bulk FinFETs to Heavy Ions Impact

1. Calomarde, A.
2. Manich, S.
3. Rubio, A.
4. Gamiz, F.

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DOI: 10.1109/ACCESS.2022.3171813 GOOGLE SCHOLAR lock_openOpen access editor

Data source: Scopus