Influence of Punch Trough Stop Layer and Well Depths on the Robustness of Bulk FinFETs to Heavy Ions Impact

  1. Calomarde, A.
  2. Manich, S.
  3. Rubio, A.
  4. Gamiz, F.
Aldizkaria:
IEEE Access

ISSN: 2169-3536

Argitalpen urtea: 2022

Alea: 10

Orrialdeak: 47169-47178

Mota: Artikulua

DOI: 10.1109/ACCESS.2022.3171813 GOOGLE SCHOLAR lock_openSarbide irekia editor