Experimental analysis of variability in WS2-based devices for hardware security

  1. Vatalaro, M.
  2. Neill, H.
  3. Gity, F.
  4. Magnone, P.
  5. Maccaronio, V.
  6. Márquez, C.
  7. Galdon, J.C.
  8. Gamiz, F.
  9. Crupi, F.
  10. Hurley, P.
  11. De Rose, R.
Revista:
Solid-State Electronics

ISSN: 0038-1101

Any de publicació: 2023

Volum: 207

Tipus: Article

DOI: 10.1016/J.SSE.2023.108701 GOOGLE SCHOLAR
Font de les dades: Scopus