Experimental analysis of variability in WS2-based devices for hardware security

  1. Vatalaro, M.
  2. Neill, H.
  3. Gity, F.
  4. Magnone, P.
  5. Maccaronio, V.
  6. Márquez, C.
  7. Galdon, J.C.
  8. Gamiz, F.
  9. Crupi, F.
  10. Hurley, P.
  11. De Rose, R.
Zeitschrift:
Solid-State Electronics

ISSN: 0038-1101

Datum der Publikation: 2023

Ausgabe: 207

Art: Artikel

DOI: 10.1016/J.SSE.2023.108701 GOOGLE SCHOLAR
Datenquelle: Scopus